2-Propanoli ≥99.5%, CMOS for microelectronic, J.T.Baker®
Toimittaja: Avantor
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Vaara
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Synonyms:
Isopropyylialkoholi
Management of Change (MOC) category = R
9059-10EA
0
EUR
9059-10
9059-BA
9059-4S
9059-98
9059-15
9059-4X
9059-09
9059-08
2-Propanoli ≥99.5%, CMOS for microelectronic, J.T.Baker®
2-Propanoli
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Kaava:
(CH₃)₂CHOH MW: 60,1 g/mol Kiehumispiste: 82 °C (1013 hPa) Sulamispiste: –89 °C Tiheys: 0,786 g/cm³ (20 °C) Leimahduspiste: 12 °C (sulj. astia) Storage Temperature: Huoneenlämpö |
MDL numero:
MFCD00011674 CAS-numero: 67-63-0 EINECS: 200-661-7 UN: 1219 ADR: 3,II REACH: 01-2119457558-25 |
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Testitulosten erittely
| For Microelectronic Use | |
| Assay (CH₃CHOHCH₃) | ≥ 99.5 % |
| Color (APHA) | ≤ 10 |
| Residue after Evaporation | ≤ 4 ppm |
| Solubility in H₂O | Passes Test |
| Water (H₂O)(by Karl Fischer titrn) | ≤ 0.05 % |
| Acidity (µeq/g) | ≤ 0.2 |
| Alkalinity (µeq/g) | ≤ 0.1 |
| Chloride (Cl) | ≤ 0.2 ppm |
| Phosphate (PO₄) | ≤ 0.3 ppm |
| Trace Impurities - Aluminum (Al) | ≤ 50.0 ppb |
| Arsenic and Antimony (as As) | ≤ 10.0 ppb |
| Trace Impurities - Barium (Ba) | ≤ 20.0 ppb |
| Trace Impurities - Beryllium (Be) | ≤ 100.0 ppb |
| Trace Impurities - Bismuth (Bi) | ≤ 100.0 ppb |
| Trace Impurities - Boron (B) | ≤ 10.0 ppb |
| Trace Impurities - Cadmium (Cd) | ≤ 20.0 ppb |
| Trace Impurities - Calcium (Ca) | ≤ 50.0 ppb |
| Trace Impurities - Chromium (Cr) | ≤ 20.0 ppb |
| Trace Impurities - Cobalt (Co) | ≤ 20 ppb |
| Trace Impurities - Copper (Cu) | ≤ 10.0 ppb |
| Trace Impurities - Gallium (Ga) | ≤ 50 ppb |
| Trace Impurities - Germanium (Ge) | ≤ 50.0 ppb |
| Trace Impurities - Gold (Au) | ≤ 20 ppb |
| Heavy Metals (as Pb) | ≤ 200.0 ppb |
| Trace Impurities - Iron (Fe) | ≤ 50.0 ppb |
| Trace Impurities - Lead (Pb) | ≤ 20.0 ppb |
| Trace Impurities - Lithium (Li) | ≤ 50.0 ppb |
| Trace Impurities - Magnesium (Mg) | ≤ 20 ppb |
| Trace Impurities - Manganese (Mn) | ≤ 15.0 ppb |
| Trace Impurities - Molybdenum (Mo) | ≤ 100.0 ppb |
| Trace Impurities - Nickel (Ni) | ≤ 10.0 ppb |
| Trace Impurities - Niobium (Nb) | ≤ 100.0 ppb |
| Trace Impurities - Potassium (K) | ≤ 100 ppb |
| Trace Impurities - Silicon (Si) | ≤ 50 ppb |
| Trace Impurities - Silver (Ag) | ≤ 20.0 ppb |
| Trace Impurities - Sodium (Na) | ≤ 100.0 ppb |
| Trace Impurities - Strontium (Sr) | ≤ 20.0 ppb |
| Trace Impurities - Tantalum (Ta) | ≤ 100.0 ppb |
| Trace Impurities - Thallium (Tl) | ≤ 10.0 ppb |
| Trace Impurities - Tin (Sn) | ≤ 100 ppb |
| Trace Impurities - Titanium (Ti) | ≤ 20 ppb |
| Trace Impurities - Vanadium (V) | ≤ 100.0 ppb |
| Trace Impurities - Zinc (Zn) | ≤ 50 ppb |
| Trace Impurities - Zirconium (Zr) | ≤ 100.0 ppb |
| Particle Count at point of fill - 0.5 µm and greater (Rion KS42AF) | ≤ 150 par/ml |
| Particle Count at point of fill - 1.0 µm and greater (Rion KS42AF) | ≤ 25 par/ml |
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