Typpihappo 65,0 - 68,0%, CMOS for microelectronic, J.T. Baker®

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9612-33EA 0 EUR
9612-33
Typpihappo 65,0 - 68,0%, CMOS for microelectronic, J.T. Baker®
Typpihappo
Kaava: HNO₃
MW: 63,01 g/mol
Storage Temperature: Huoneenlämpö
MDL numero: MFCD00011349
UN: 2031
ADR: 8,II

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Testitulosten erittely

For Microelectronic Use
Assay (HNO₃) 65.0 - 67.9 %
Appearance Passes Test
Color (APHA) ≤ 10
Residue after Ignition ≤ 2 ppm
Chloride (Cl) ≤ 0.08 ppm
Phosphate (PO₄) ≤ 0.10 ppm
Sulfate (SO₄) ≤ 0.2 ppm
Trace Impurities - Aluminum (Al) ≤ 40.0 ppb
Arsenic and Antimony (as As) ≤ 5.0 ppb
Trace Impurities - Barium (Ba) ≤ 10.0 ppb
Trace Impurities - Beryllium (Be) ≤ 10.0 ppb
Trace Impurities - Bismuth (Bi) ≤ 20.0 ppb
Trace Impurities - Boron (B) ≤ 10.0 ppb
Trace Impurities - Cadmium (Cd) ≤ 50 ppb
Trace Impurities - Calcium (Ca) ≤ 50.0 ppb
Trace Impurities - Chromium (Cr) ≤ 30.0 ppb
Trace Impurities - Cobalt (Co) ≤ 10.0 ppb
Trace Impurities - Copper (Cu) ≤ 10.0 ppb
Trace Impurities - Gallium (Ga) ≤ 10.0 ppb
Trace Impurities - Germanium (Ge) ≤ 20 ppb
Trace Impurities - Gold (Au) ≤ 20 ppb
Heavy Metals (as Pb) ≤ 100 ppb
Trace Impurities - Iron (Fe) ≤ 40.0 ppb
Trace Impurities - Lead (Pb) ≤ 20.0 ppb
Trace Impurities - Lithium (Li) ≤ 10.0 ppb
Trace Impurities - Magnesium (Mg) ≤ 20 ppb
Trace Impurities - Manganese (Mn) ≤ 10.0 ppb
Trace Impurities - Nickel (Ni) ≤ 20.0 ppb
Trace Impurities - Niobium (Nb) ≤ 50.0 ppb
Trace Impurities - Potassium (K) ≤ 50 ppb
Trace Impurities - Silicon (Si) ≤ 50 ppb
Trace Impurities - Silver (Ag) ≤ 20.0 ppb
Trace Impurities - Sodium (Na) ≤ 150.0 ppb
Trace Impurities - Strontium (Sr) ≤ 30.0 ppb
Trace Impurities - Tantalum (Ta) ≤ 10.0 ppb
Trace Impurities - Thallium (Tl) ≤ 10.0 ppb
Trace Impurities - Tin (Sn) ≤ 20.0 ppb
Trace Impurities - Titanium (Ti) ≤ 10.0 ppb
Trace Impurities - Vanadium (V) ≤ 10.0 ppb
Trace Impurities - Zinc (Zn) ≤ 20.0 ppb
Trace Impurities - Zirconium (Zr) ≤ 10.0 ppb
Particle Count - 0.5 µm and greater ≤ 60 par/ml
Particle Count - 1.0 µm and greater ≤ 10 par/ml

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