Asetoni, VLSI for microelectronic, J.T. Baker®

Toimittaja: Avantor
Vaara

Synonyms: Propanone

5356-05EA 0 EUR
5356-05
Asetoni, VLSI for microelectronic, J.T. Baker®
Asetoni
Kaava: CH₃COCH₃
MW: 58,08 g/mol
Kiehumispiste: 56,2 °C (1013 hPa)
Sulamispiste: –95,4 °C
Tiheys: 0,792 g/cm³ (20 °C)
Leimahduspiste: <–20 °C (sulj. astia)
Storage Temperature: Huoneenlämpö
MDL numero: MFCD00008765
CAS-numero: 67-64-1
EINECS: 200-662-2
UN: 1090
ADR: 3,II
REACH: 01-2119471330-49
Merck Index: 13,00067
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Testitulosten erittely

For Microelectronic Use
Assay ((CH₃)₂CO) (by GC, corrected for water) ≥99.5 %
Color (APHA) ≤10
Residue after Evaporation ≤5 ppm
Acidity (µeq/g) ≤0.3
Alkalinity (µeq/g) ≤0.5
Water (H₂O) ≤0.5 %
Solubility in H₂O Passes Test
Chloride (Cl) ≤0.2 ppm
Phosphate (PO₄) ≤0.05 ppm
Trace Impurities - Aluminum (Al) ≤50.0 ppb
Arsenic and Antimony (as As) ≤5.0 ppb
Trace Impurities - Barium (Ba) ≤20.0 ppb
Trace Impurities - Boron (B) ≤20.0 ppb
Trace Impurities - Calcium (Ca) ≤25.0 ppb
Trace Impurities - Chromium (Cr) ≤20.0 ppb
Trace Impurities - Copper (Cu) ≤10.0 ppb
Trace Impurities - Gold (Au) ≤20 ppb
Trace Impurities - Iron (Fe) ≤20.0 ppb
Trace Impurities - Lead (Pb) ≤20.0 ppb
Trace Impurities - Lithium (Li) ≤50.0 ppb
Trace Impurities - Magnesium (Mg) ≤20 ppb
Trace Impurities - Manganese (Mn) ≤10.0 ppb
Trace Impurities - Nickel (Ni) ≤10.0 ppb
Trace Impurities - Potassium (K) ≤50 ppb
Trace Impurities - Sodium (Na) ≤50.0 ppb
Trace Impurities - Tin (Sn) ≤50 ppb
Trace Impurities - Titanium (Ti) ≤20 ppb
Trace Impurities - Zinc (Zn) ≤50 ppb
Particle Count - 0.5 µm and greater ≤60 par/ml
Particle Count - 1.0 µm and greater ≤8 par/ml
Reported value is the average of all samples counted for this lot number,with no individual sample value exceeding the specification.

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